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Pulsed laser deposition growth cartoon.
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Resonant elastic x-ray scattering cartoon.
Atomic Force Microscopy
SrTiO3 substrate treated with thermal annealing and DI water etching. Each terrace is 0.39 nm tall.
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Research overview

Focus

Our research is centered on realizing novel phases of matter through atomic layer engineering. We achieve this precision by utilizing pulsed laser deposition to deposit single layers of materials on single crystal substrates. This allows unique stacking patterns to be obtained leading to emergent phases unavailable in bulk materials. Understanding the interplay of the strong interactions within these interfacial materials and how this leads to the observed phase behavior is the core of our work.

Materials

We specialize in thin-film synthesis of complex oxides. These materials exhibit numerous exciting behaviors even in bulk form such as superconductivity, charge and spin density waves, and colossal magnetoresistance. Beyond these scientifically and technologically important phases, these materials are exciting candidates for emergent topological behaviors which are highly relevant to current efforts to realize practical topological quantum computers.

Techniques

In order to explore the properties and understand the behaviors of these artificial materials, we utilize numerous characterization techniques. At OSU we perform atomic force microscopy, x-ray diffraction, electronic and magentic transport, and reflection high energy electron diffraction measurements. For more advanced measurements we travel to national synchrotron laboratories and perform highly specialized measurements such as resonant elastic and inelastic x-ray scattering, angle-resolved photoemission spectroscopy, and x-ray absoprtion spectroscopy. 

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